Surface Potential Investigation of Fullerene Derivative Film on Platinum Electrode under UV Irradiation by Kelvin Probe Force Microscopy Using a Piezoelectric Cantilever
Surface Potential Investigation of Fullerene Derivative Film on Platinum Electrode under UV Irradiation by Kelvin Probe Force Microscopy Using a Piezoelectric Cantilever
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DOI：
10.1380/ejssnt.2015.102
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发表时间：
2015-03
影响因子：
0.7
通讯作者：
N. Satoh;S. Katori;K. Kobayashi;S. Watanabe;T. Fujii;K. Matsushige;Hirofumi Yamada
中科院分区：
文献类型：
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作者：
N. Satoh;S. Katori;K. Kobayashi;S. Watanabe;T. Fujii;K. Matsushige;Hirofumi Yamada
动态模式原子力显微镜（DFM）结合开尔文探针力显微镜（KFM）已成为一个强大的工具，不仅用于成像的表面形貌，但也用于调查表面电位的纳米级分辨率。我们已经开发了DFM / KFM使用微制造的悬臂梁与锆钛酸铅（PZT）压电薄膜（CID：12）作为一个DE（CID：13）截面传感器。所观察的样品可以处于完全黑暗的环境中，因为在我们的实验装置中不需要用于悬臂检测的光学器件，该实验装置还配备有将紫外（UV）光照射到样品上的机构。我们制备了硅上铂衬底并通过真空蒸发用两个荫罩在交叉方向上沉积富勒烯衍生物（PCBM; [6，6]-苯基-C61-丁酸甲酯）（cid：12）lm图案。能带弯曲的能带图，它是通过使用开发的DFM / KFM同时获得同一区域的地形和表面电位图像来创建的。[DOI：10.1380/ejssnt.2015.102]
Dynamic-mode atomic force microscopy (DFM) combined with Kelvin probe force microscopy (KFM) has been a powerful tool not only for imaging surface topography but also for investigating surface potential on a nanometer-scale resolution. We have developed DFM / KFM using a microfabricated cantilever with a lead zirconate titanate (PZT) piezoelectric thin (cid:12)lm used as a de(cid:13)ection sensor. The observed sample can be in a completely dark environment because no optics are required for cantilever de(cid:13)ection sensing in our experimental setup, which is also equipped with a mechanism to irradiate ultraviolet (UV) light onto the sample. We prepared a platinum-on-silicon substrate and deposited fullerene-derivative (PCBM; [6,6]-Phenyl-C 61 -Butyric Acid Methyl Ester) (cid:12)lm patterns by vacuum evaporation with two shadow masks in crossed directions. The energy band diagram with band-bending, it was created by simultaneously obtaining topographic and surface potential images of the same area using the developed DFM / KFM. [DOI: 10.1380/ejssnt.2015.102]