TEM Investigations on Layered Ternary Ceramics
TEM Investigations on Layered Ternary Ceramics
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DOI：
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发表时间：
2009-10
影响因子：
10.9
通讯作者：
Zhijun Lin;Mei-shuan Li;Y. Zhou
中科院分区：
文献类型：
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作者：
Zhijun Lin;Mei-shuan Li;Y. Zhou
层状三元陶瓷代表了一类新的固体，联合收割机结合了金属和陶瓷的优点。这些独特的。性能与它们的层状晶体结构和微观结构密切相关。原子分辨率Z衬度扫描透射电子显微镜（STEM）和透射电子显微镜（TEM），选区电子衍射（SAED），会聚束电子衍射（CBED）的组合代表了一种强大的方法，将材料的微观结构与宏观性能联系起来，使层状三元陶瓷能够以前所未有的细节进行研究。使用TEM获得的微观结构信息是有用的，在理解的形成机制，分层堆叠特性，和缺陷结构的层状三元陶瓷下降到原子尺度水平，从而提供洞察理解的“工艺-结构-性能”关系的层状三元陶瓷。综述了Ti-Si-C、Ti-Al-C、Cr-Al-C、Zr-Al-C、Ta-Al-C和Ti-Al-N系三元层状陶瓷的透射电镜表征。
Layered ternary ceramics represent a new class of solids that combine the merits of both metals and ceramics. These unique. properties are strongly related to their layered crystal structures and microstructures. The combination of atomic-resolution Z-contrast scanning transmission electron microscopy (STEM) and transmission electron microscopy (TEM), selected area electron diffraction (SAED), convergent beam electron diffraction (CBED) represents a powerful method to link microstructures of materials to macroscopic properties, allowing layered ternary ceramics to be investigated in an unprecedented detail. Microstructural information obtained using TEM is useful in understanding the formation mechanism, layered stacking characteristics, and defect structures for layered ternary ceramics down to atomic-scale level; and thus provides insight into understanding the "Processing-Structure-Property" relationship of layered ternary ceramics. Transmission electron microscopic characterizations of layered ternary ceramics in Ti-Si-C, Ti-Al-C, Cr-Al-C, Zr-Al-C, Ta-Al-C and Ti-Al-N systems are reviewed.