X-ray phase-contrast microscopy and microtomography
X-ray phase-contrast microscopy and microtomography
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DOI：
10.1364/oe.11.002289
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发表时间：
2003-09-22
期刊：
影响因子：
3.8
通讯作者：
Wilkins, SW
中科院分区：
文献类型：
--
作者：
Mayo, SC;Davis, TJ;Wilkins, SW
同轴相位对比度使弱吸收样品能够成功地用X射线成像，并大大提高了在较强吸收样品中细微尺度结构的可见性。这种类型的相位对比度需要空间相干光束，这是微聚焦X射线源可以满足的条件。基于这样的光源，我们研制了一台X射线显微镜，它能够进行高分辨率的相衬成像和层析成像。相位恢复可以从已知组成和密度的均匀样品的相差显微镜图像中恢复定量信息，并提高层析重建的质量。(C)2003年美国光学学会
In-line phase contrast enables weakly absorbing specimens to be imaged successfully with x-rays, and greatly enhances the visibility of fine scale structure in more strongly absorbing specimens. This type of phase contrast requires a spatially coherent beam, a condition that can be met by a microfocus x-ray source. We have developed an x-ray microscope, based on such a source, which is capable of high resolution phase-contrast imaging and tomography. Phase retrieval enables quantitative information to be recovered from phase-contrast microscope images of homogeneous samples of known composition and density, and improves the quality of tomographic reconstructions. (C) 2003 Optical Society of America