X-ray interference effects on the determination of structural data in ultrathin La2/3Sr1/3MnO3 epitaxial thin films
X-ray interference effects on the determination of structural data in ultrathin La2/3Sr1/3MnO3 epitaxial thin films
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DOI：
10.1063/1.3663574
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发表时间：
2011-11
影响因子：
4
通讯作者：
D. Pesquera;R.Bachelet;G. Herranz;J. Fontcuberta;X.Marti;V.Holy
中科院分区：
文献类型：
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作者：
D. Pesquera;R.Bachelet;G. Herranz;J. Fontcuberta;X.Marti;V.Holy
我们分析x-射线衍射数据，以提取细胞参数的紧密匹配的基板上的薄膜。我们主要研究在（001）SrTiO_3单晶衬底上外延生长的La_（2/3）Sr_（1/3）MnO_3薄膜。它将被证明，由于薄膜和衬底的结构相似性极高，数据分析必须明确考虑衬底和薄膜的衍射波的不同相位，以提取可靠的晶胞参数。这一发现的影响，为理解应变效应的薄膜和接口将被强调。
We analyze x-ray diffraction data to extract cell parameters of ultrathin films on closely matching substrates. We focus on epitaxial La2/3Sr1/3MnO3 films grown on (001) SrTiO3 single crystalline substrates. It will be shown that, due to extremely high structural similarity of film and substrate, the data analysis must explicitly consider the distinct phase of the diffracted waves by substrate and films to extract reliable unit cell parameters. The implications of this finding for the understanding of strain effects in ultrathin films and interfaces will be underlined.