Neutron diffraction study on stress-induced X-phase in Ni2MnGa
Neutron diffraction study on stress-induced X-phase in Ni2MnGa
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DOI:
10.1016/j.scriptamat.2008.10.018
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发表时间:
2009-02-01
影响因子:
6
通讯作者:
Kakurai, Kazuhisa
中科院分区:
文献类型:
--
作者:
Kushida, Hiroaki;Terai, Tomoyuki;Kakurai, Kazuhisa
Neutron diffraction profiles of the X-phase in Ni2MnGa, which is induced by applying a compressive stress, have revealed that two satellite reflections appear at incommensurate positions of [h2 - h0](p)*, with h = 0.360 and 1.638 at 240 K under a compressive stress of about 30 MPa. The satellite positions of the X-phase are clearly different from those of the martensite and intermediate phases. (C) 2008 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.