NiOx Hole Transport Layer for Perovskite Solar Cells with Improved Stability and Reproducibility
NiOx Hole Transport Layer for Perovskite Solar Cells with Improved Stability and Reproducibility
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DOI：
10.1021/acsomega.7b00538
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发表时间：
2017-05-01
期刊：
影响因子：
4.1
通讯作者：
Miyano, Kenjiro
中科院分区：
文献类型：
--
作者：
Islam, Md. Bodiul;Yanagida, Masatoshi;Miyano, Kenjiro
在这项研究中，开发了具有NiOx界面的高度稳定、低温加工的平面卤化铅钙钛矿（MAPbI(3)-(x)Clx）太阳能电池。我们的太阳能电池在30°C、1个太阳光照（无紫外光过滤）下的最大功率点跟踪（MPPT）下，在超过670小时内保持超过85%的初始效率，在相同MPPT条件下的加速老化测试（85°C）超过1000小时，保持超过73%的初始效率。将封装的器件在 85°C 的黑暗条件下存放 1000 小时以上，结果表明性能没有下降。延长器件寿命的关键因素是溅射沉积的多晶 NiOx 空穴传输层 (HTL)。我们观察到 NiOx 的特性取决于其成分。当 Ni3+/Ni2+ 比率较高时，NiOx 的电导率较高，但会牺牲光学透过率。在优化的 NiOx 条件下，我们获得了 15.2% 的最高功率转换效率。溅射氧化镍薄膜无需退火或任何其他处理即可用于制造太阳能电池。与使用PEDOT: PSS HTL的器件相比，器件稳定性显着增强。我们清楚地证明了光照引起的退化在很大程度上取决于倒置钙钛矿太阳能电池（PVSC）中 HTL 的性质。溅射 NiOx HTL 可以成为解决卤化铅 PVSC 稳定性问题的良好候选者。
In this study, highly stable, low-temperatureprocessed planar lead halide perovskite (MAPbI(3)-(x)Clx) solar cells with NiOx interfaces have been developed. Our solar cells maintain over 85% of the initial efficiency for more than 670h, at the maximum power point tracking ( MPPT) under 1 sun illumination ( no UV-light filtering) at 30 C, and over 73% of the initial efficiency for more than 1000 h, at the accelerating aging test ( 85 C) under the same MPPT condition. Storing the encapsulated devices at 85 C in dark over 1000 h revealed no performance degradation. The key factor for the prolonged lifetime of the devices was the sputter- deposited polycrystalline NiOx hole transport layer ( HTL). We observed that the properties of NiOx are dependent on its composition. At a higher Ni3+/ Ni2+ ratio, the conductivity of NiOx is higher, but at the expense of optical transmittance. We obtained the highest power conversion efficiency of 15.2% at the optimized NiOx condition. The sputtered NiOx films were used to fabricate solar cells without annealing or any other treatments. The device stability enhanced significantly compared to that of the devices with PEDOT: PSS HTL. We clearly demonstrated that the illuminationinduced degradation depends heavily on the nature of the HTL in the inverted perovskite solar cells (PVSCs). The sputtered NiOx HTL can be a good candidate to solve stability problems in the lead halide PVSCs.