Impacts of carbon impurities in hydrogen plasmas on tungsten blistering
Impacts of carbon impurities in hydrogen plasmas on tungsten blistering
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DOI：
10.1088/0029-5515/44/1/007
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发表时间：
2004
期刊：
影响因子：
3.3
通讯作者：
Y. Ueda;T. Shimada;M. Nishikawa
中科院分区：
文献类型：
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作者：
Y. Ueda;T. Shimada;M. Nishikawa
为了研究等离子体中碳杂质对钨第一壁的影响，采用氢碳混合离子束辐照钨。发现非常少量的碳（~0.3%或更多）显著增强气泡形成。在~1023 H m−2的能量密度下出现小气泡，在1024 H m−2的能量密度范围内气泡数量增加。然后，气泡的大小增加到1025 H m−2范围。根据XPS分析，在观察到显著气泡的情况下，靠近顶表面的所有钨原子与碳原子结合以形成碳化钨层。这一层防止注入的氢离开钨。因此，它导致增强扩散到本体中，导致气泡形成。
In order to study the effect of carbon impurities in plasmas on tungsten first walls, a hydrogen–carbon mixed ion beam was irradiated on tungsten. It was found that a very small amount of carbon (~0.3% or more) significantly enhanced blister formation. Small blisters appeared in a fluence of ~1023 H m−2 and their number increased in the 1024 H m−2 range. Then, the size of the blisters increased towards the 1025 H m−2 range. According to XPS analysis, all the tungsten atoms near the top surface were combined with carbon atoms to form a tungsten carbide layer in the cases where significant blisters were observed. This layer prevented the implanted H from leaving the tungsten. As a result, it caused enhanced diffusion into the bulk, leading to blister formation.