Error modelling of quantum Hall array resistance standards
Error modelling of quantum Hall array resistance standards
复制标题
量子霍尔阵列电阻标准的误差建模
DOI:
10.1088/1681-7575/aaa5c1
复制
发表时间:
2018
期刊:
影响因子:
2.4
通讯作者:
and Nobu-Hisa Kaneko
中科院分区:
文献类型:
--
作者:
Martina Marzano;Takehiko Oe;Massimo Ortolano;Luca Callegaro;and Nobu-Hisa Kaneko
Quantum Hall array resistance standards (QHARSs) are integrated circuits composed of interconnected quantum Hall effect elements that allow the realization of virtually arbitrary resistance values. In recent years, techniques were presented to efficiently design QHARS networks. An open problem is that of the evaluation of the accuracy of a QHARS, which is affected by contact and wire resistances. In this work, we present a general and systematic procedure for the error modelling of QHARSs, which is based on modern circuit analysis techniques and Monte Carlo evaluation of the uncertainty. As a practical example, this method of analysis is applied to the characterization of a 1 MΩ QHARS developed by the National Metrology Institute of Japan. Software tools are provided to apply the procedure to other arrays.