A new approach for improved time and position measurements for TOF-PET: Time-stamping of the photo-electrons using analogue SiPMs
A new approach for improved time and position measurements for TOF-PET: Time-stamping of the photo-electrons using analogue SiPMs
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改进 TOF-PET 时间和位置测量的新方法：使用模拟 SiPM 对光电子进行时间戳
DOI：
10.1016/j.nima.2017.01.008
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发表时间：
2017
影响因子：
1.4
通讯作者：
M. Williams
中科院分区：
文献类型：
--
作者：
K. Doroud;M. Williams
对511keV伽马的飞行时间(TOF)的测量大大减少了PET图像中的统计噪声，更精确的时间测量产生了更清晰的图像。将光电探测器耦合到闪烁晶体的常见方法是有两个匹配矩阵，在晶体和光电探测器之间一对一地耦合。我们提出了一种基于模拟条形SiPM读出切割成薄片的闪烁体的新几何结构。这项技术允许对单个光电子进行时间标记，并使用特定的算法提取最佳时间分辨率。在这里，我们介绍了第一个‘平板模块’测试的结果。
Measurement of the Time-of-Flight (TOF) of the 511 keV gammas brings an important reduction of statistical noise in the PET image, with higher precision time measurements producing clearer images. The common method of coupling a photodetector to scintillating crystals is to have two matching matrices, with a one-to-one coupling between the crystal and the photodetector. We propose a new geometry based on analogue strip SiPMs reading out a scintillator cut into slabs. This technique allows the time stamping of individual photo-electrons and extracts the best time resolution using a specific algorithm. Here we present the results from the first ‘slab module’ test.