Revealing Phonon Polaritons in Hexagonal Boron Nitride by Multipulse Peak Force Infrared Microscopy
Revealing Phonon Polaritons in Hexagonal Boron Nitride by Multipulse Peak Force Infrared Microscopy
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DOI：
10.1002/adom.201901084
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发表时间：
2019-11
影响因子：
9
通讯作者：
Le Wang;M. Wagner;Haomin Wang;Siuling Pau‐Sanchez;Jiahan Li;J. Edgar;Xiaoji G. Xu
中科院分区：
文献类型：
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作者：
Le Wang;M. Wagner;Haomin Wang;Siuling Pau‐Sanchez;Jiahan Li;J. Edgar;Xiaoji G. Xu
利用纳米空间分辨率的光谱成像技术，可以方便地探测二维材料中的极化子。原子力显微镜和红外激光光源的结合为声子极化子的原位映射提供了途径。证明了基于光热峰力红外显微镜能够在不破坏样品的情况下，揭示高空间分辨率的同位素纯六方氮化硼微结构中的声子极化子。为了进一步提高灵敏度，采用多脉冲激光激发的方案对峰值力红外显微镜进行了增强。由此产生的多脉冲峰值力红外显微镜方法可以高灵敏度地探测声子极化子，这对于探测具有高阻尼性的二维材料中的极化子特别有用。
Probing of polaritons in 2D materials is facilitated by spectroscopic imaging with nanometer spatial resolution. The combination of atomic force microscopy and infrared laser sources provides access for in situ mappings of phonon polaritons. Here, it is demonstrated that the photothermal‐based peak force infrared microscopy is capable of revealing phonon polaritons with high spatial resolution in isotopically pure hexagonal boron nitride microstructures without damaging the sample. To further improve the sensitivity, peak force infrared microscopy is enhanced with a scheme of multiple laser pulse excitation. The resulting method of multipulse peak force infrared microscopy can detect phonon polaritons with high sensitivity, which is particularly useful for probing polaritons in 2D materials with high damping characteristics.