Enhancement of Exchange Bias in the ${\rm Co}_{2}{\rm FeSi/IrMn}$ System
Enhancement of Exchange Bias in the ${\rm Co}_{2}{\rm FeSi/IrMn}$ System
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DOI：
10.1109/tmag.2011.2151838
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发表时间：
2011-09
影响因子：
2.1
通讯作者：
N. P. Aley;S. Takayama;A. Hirohata;K. O’Grady
中科院分区：
文献类型：
--
作者：
N. P. Aley;S. Takayama;A. Hirohata;K. O’Grady
研究了溅射多晶Co2 FeSi（CFS）薄膜的结构和磁性。已被用来测量的磁化强度，磁化率，晶粒尺寸和组成的深度分布的退火条件和种子层的选择的函数的变化，X-射线衍射和X-射线光子光谱的组合。当沉积在Cr种子层上并在573 K退火时，CFS薄膜显示出有序的B2结构。退火温度的进一步增加被发现破坏CFS的结晶度，并导致Si偏析在界面处。在获得优化的生长工艺后，研究了反铁磁IrMn的CFS的交换偏置。当在CFS/IrMn界面处添加超薄层CoFe时，由于界面耦合强度的增加，CFS的交换偏置增加了15%。
The structural and magnetic properties of sputtered polycrystalline Co2FeSi (CFS) thin films have been studied. A combination of magnetometry, X-ray diffraction, and X-ray photon spectrometry have been used to measure the changes in magnetization, coercivity, grain size and compositional depth profile as a function of annealing conditions and seed-layer choice. The CFS thin films displayed an ordered B2 structure when deposited on a Cr seed layer and annealed at 573 K. Further increases in annealing temperature were found to disrupt the crystallinity of the CFS and lead to Si segregation at the interface. After obtaining an optimized growth process, a study of the exchange biasing of CFS with the antiferromagnetic (AF) IrMn was made. A 15% enhancement of the exchange bias of CFS was found when an ultra-thin-layer CoFe was added at the CFS/IrMn interface due to an increase in the strength of the interfacial coupling.