Galvanic corrosion of selected dental alloys.
Galvanic corrosion of selected dental alloys.
复制标题
选定牙科合金的电偶腐蚀。
DOI：
10.1111/j.1365-2842.2001.00728.x
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发表时间：
2001
影响因子：
2.9
通讯作者：
I. Hinberg
中科院分区：
文献类型：
--
作者：
J. Karov;I. Hinberg
来自三个不同品牌的银汞合金样品被连接到两个金合金和正畸托槽上。在得到的原电池中，与金偶联的汞齐是阳极，表现出比未偶合的0.2-0.5微安的腐蚀电流密度高一个数量级的电偶电流密度。将银汞合金偶联到正畸托槽上，产生的电流密度与未偶联的样品相同。阳极处的腐蚀电流密度比测量的电偶电流密度高出6倍。刷牙导致电流密度瞬间增加，在100%S范围内衰减到以前的稳态水平。刷刷银汞合金/托槽对后，会产生一个阳极峰，然后是短暂的极化反转，在此期间托槽是阳极。
Samples prepared from three different amalgam brands were coupled to two gold alloys and orthodontic brackets. In the resulting galvanic cells, the amalgam coupled to gold were anodic, exhibiting galvanic current densities about one order of magnitude higher than the uncoupled corrosion current densities of 0.2-0.5 microA. Coupling amalgams to orthodontic brackets resulted in galvanic current densities of the same magnitude as the uncoupled samples. Corrosion current densities at the anode were found to be up to six times higher than the measured galvanic current densities. Brushing caused transient increases in galvanic current densities that decayed within 100 s to the previous steady state levels. Brushing of amalgam/bracket couples, caused an anodic peak followed by brief polarization reversal during which the brackets were anodic.