Input Referred Comparator Noise in SAR ADCs
Input Referred Comparator Noise in SAR ADCs
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DOI：
10.1109/tcsii.2019.2909429
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发表时间：
2019-04
期刊：
影响因子：
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通讯作者：
Yanquan Luo;Ankesh Jain;J. Wagner;M. Ortmanns
中科院分区：
文献类型：
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作者：
Yanquan Luo;Ankesh Jain;J. Wagner;M. Ortmanns
在逐次逼近寄存器（SAR）ADC中，比较器噪声通常是主要误差源之一。在本简介中，比较器的输入参考噪声与SAR ADC中的噪声之间的关系。当比较器噪声返回ADC输入时，发现比例因子小于1。当比较器同时包含热噪声和闪烁噪声时，当参考ADC输入时，噪声曲线保持不变;但是，由于采样引起的混叠，ADC输出处的闪烁噪声转折频率被推向比比较器的闪烁噪声转折频率更低的频率。分析得出的结果，并通过仿真和测量证明。
In a successive-approximation-register (SAR) ADC, comparator noise is often one of the dominant error sources. In this brief, the relation between the input referred noise of a comparator and its resulting noise in an SAR ADC is presented. A scaling factor less than unity is found when the comparator noise is referred back to the ADC input. When the comparator contains both thermal and flicker noise, the noise profile is maintained when referred back to the ADC input; however, due to aliasing caused by sampling, the flicker noise corner at the ADC output is pushed toward lower frequencies compared with the flicker noise corner frequency of the comparator. The results are analytically derived and proven by simulation and measurement.