Generalized Transforms for Multiple Valued Circuits and Their Fault Detection
Generalized Transforms for Multiple Valued Circuits and Their Fault Detection
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多值电路的广义变换及其故障检测
DOI：
10.1109/12.165392
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发表时间：
1992
期刊：
影响因子：
--
通讯作者：
T. Damarla
中科院分区：
文献类型：
--
作者：
T. Damarla
出现了用于获得多价值（MV）函数的规范表示的简单转换（0，1，.。。。。。。。。。。。。。。。。。。。。。。。。。。。。。。。。。。。。。。。。。。。。函数的变量数量。规范表示中的系数称为光谱系数。给出了功能的功能值与其光谱系数之间的各种关系。使用测试模式和光谱技术考虑任意MV网络中的故障检测。在输入线处检测卡在静止和桥接故障的测试模式数量上的上限分别显示为PN和N-1。通过光谱技术检测故障，是根据受故障影响的光谱系数数量进行的，因此它独立于用于构建网络的技术和故障的类型。检测（e）中任何故障的测试集生成，其中（e）表示网络中的所有故障。获得检测（e）中所有故障所需的测试模式数量的上限。 >
Simple transforms for obtaining canonical representation of multiple-valued (MV) functions in polarity k, k in (0, 1,. . ., p/sup n/-1), are presented, where p and n denote the radix and the number of variables of a function. The coefficients in a canonical representation are called spectral coefficients. Various relationships between the functional values of a function and its spectral coefficients are given. Fault detection in an arbitrary MV network is considered using test patterns and spectral techniques. Upper bounds on the number of test patterns for detection of stuck-at and bridging faults at the input lines are shown to be pn and n-1, respectively. Fault detection by spectral techniques is done based on the number of spectral coefficients affected by a fault, and hence it is independent of the technology used for construction of networks and the type of fault. Test set generation for detection of any fault in (E), where (E) denotes all faults in the network, is given. An upper bound on the number of test patterns required to detect all faults in (E) is obtained. >