Experimental Demonstration of Light-Trapping Transparent Electrode Geometries
Experimental Demonstration of Light-Trapping Transparent Electrode Geometries
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DOI：
10.1021/acsphotonics.2c01468
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发表时间：
2023-02-09
期刊：
影响因子：
7
通讯作者：
Kik, Pieter G.
中科院分区：
文献类型：
--
作者：
Sun, Mengdi;Golvari, Pooria;Kik, Pieter G.
电导率和透明度之间的内在权衡长期以来阻碍了真正透明电极的开发。最近，引入了一种透明电极设计，它具有极高的导电性，同时允许入射光几乎完全传输到下面的光学器件中。该方法基于使用嵌入透明介电薄膜的具有倾斜表面的金属线。样品金属区域反射的光可以通过全内反射恢复，从而有效捕获入射到导电区域的光。原型电极几何形状是通过多光子光刻和选择性化学沉积制造的。通过光学显微镜和激光扫描实验观察超过 25 度的表面倾斜角的光捕获。金属电极表面反射的大约 60% 的光通过全内反射被恢复。所提出的方法可以使光电器件在宽光谱带宽上显着提高性能。
The intrinsic trade-off between conductivity and transparency has long impeded the development of truly transparent electrodes. Recently, a transparent electrode design was introduced that promised remarkably high electrical conductivity while allowing near-complete transmission of incident light into the underlying optical device. The approach is based on the use of metallic wires with inclined surfaces, embedded in a transparent dielectric film. Light reflected by metallic regions of the sample can be recovered by total internal reflection, resulting in efficient trapping of light incident on conductive regions. Prototype electrode geometries were fabricated by multiphoton lithography and selective chemical deposition. Light trapping is observed by optical microscopy and laser scanning experiments for surface tilt angles exceeding 25 degrees. Approximately 60% of light reflected by the metallic electrode surface was recovered through total internal reflection. The presented approach could lead to optoelectronic devices with significantly improved performance across a wide spectral bandwidth.