Performance of Transparent Metallic Thin Films
Performance of Transparent Metallic Thin Films
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DOI：
10.1021/acs.jpcc.1c04832
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发表时间：
2021-07
期刊：
影响因子：
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通讯作者：
Yanfeng Wang;Fei Yang;Zhengjun Zhang;Yiping Zhao
中科院分区：
文献类型：
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作者：
Yanfeng Wang;Fei Yang;Zhengjun Zhang;Yiping Zhao
透明金属薄膜(TMF)具有在机械变形下同时保持高导电性和光学透明性的能力，是透明导电薄膜的最佳候选材料。然而，目前还缺乏合适的模型来预测信托基金的整体业绩。本文提出了基于网络电阻模型、基尔霍夫规则、基于有效介质理论、几何模型和Beer-Lambert定律的电阻率和透过率随厚度变化的经验关系式。系统地研究了银纳米孔阵列TMF的厚度和穿孔面积比与PR的关系。无论TMF的晶格结构如何，这两个模型都与我们的实验数据和文献报道的数据吻合得很好。得到了TMF的综合优值系数表达式：Φ=Tβ/Rs。实验数据和理论预测都表明，与β=10相比，β=5更能表征纳米孔阵列TMF的性能。所观察到的经验模型和FOM表达式不仅可以用来评估任何类型的TMF的整体质量，而且还可以为制造提供指导。
The ability to maintain high electrical conductivity and optical transparency simultaneously under mechanical deformation has made transparent metallic films (TMFs) the best candidates among transparent conductive films (TCFs). However, there is a lack of suitable models to predict the overall performance of the TMFs. Here, empirical relationships for resistanceRsbased on the network resistor model, Kirchoff’s rules, and the thickness-dependent resistivity and transmissionTbased on the effective medium theory, the geometric model, and the Beer–Lambert law are proposed. A systematic thicknesst- and perforation area ratio PR-dependent study on the silver nanohole array TMF has been performed. Both models fit well with our experimental data as well as the data reported in the literature, regardless of the lattice structure of the TMFs. A general and comprehensive figure-of-merit (FOM) expression for TMFs, Φ =Tβ/Rs, is obtained. Both the experimental data and the theoretical predictions show that β = 5 is better to characterize the performance of nanohole array TMFs as compared to β = 10 for TCFs. The observed empirical models and the FOM expression not only can be used to assess the overall quality of any type of TMFs but also provide guidance for fabrication.