The Advanced Implantation Detector Array (AIDA)

The Advanced Implantation Detector Array (AIDA)
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DOI:
10.1016/j.nima.2023.168166
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发表时间:
2023-02
期刊:
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
影响因子:
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通讯作者:
O. Hall;T. Davinson;C. Griffin;P. Woods;C. Appleton;C. Bruno;A. Estrade;D. Kahl;L. Sexton;I. Burrows;P. Coleman-Smith;M. Cordwell;A. Grant;M. Kogimtzis;M. Labiche;J. Lawson;I. Lazarus;P. Morall;V. Pucknell;J. Simpson;C. Unsworth;D. Braga;M. Prydderch;S. Thomas;L. Harkness-Brennan;P. Nolan;R. Page;D. Seddon
O. Hall;T. Davinson;C. Griffin;P. Woods;C. Appleton;C. Bruno;A. Estrade;D. Kahl;L. Sexton;I. Burrows;P. Coleman-Smith;M. Cordwell;A. Grant;M. Kogimtzis;M. Labiche;J. Lawson;I. Lazarus;P. Morall;V. Pucknell;J. Simpson;C. Unsworth;D. Braga;M. Prydderch;S. Thomas;L. Harkness-Brennan;P. Nolan;R. Page;D. Seddon
中科院分区:
其他
文献类型:
--
作者:
O. Hall;T. Davinson;C. Griffin;P. Woods;C. Appleton;C. Bruno;A. Estrade;D. Kahl;L. Sexton;I. Burrows;P. Coleman-Smith;M. Cordwell;A. Grant;M. Kogimtzis;M. Labiche;J. Lawson;I. Lazarus;P. Morall;V. Pucknell;J. Simpson;C. Unsworth;D. Braga;M. Prydderch;S. Thomas;L. Harkness-Brennan;P. Nolan;R. Page;D. Seddon

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先进植入探测器阵列(AIDA)是一种先进的探测系统,用于测量破碎/裂变设施中外来核的衰变特性。围绕8个8厘米× 8厘米、128× 128条(16384像素)或4个24厘米× 8厘米、384× 128条(49152像素)双面硅条探测器堆叠而成,注入离子及其随后衰变产物的位置可以测量到亚毫米精度。每个探测器的大量像素提供了以植入率~ kHz的植入衰减相关性。为了处理来自大量条带的信号,应用特定的集成电路提供每个条带(20 GeV和20 MeV满量程范围)的低增益和高增益信号处理,动态范围为1000:1,或更好。介绍了系统的概述和使用的分析方法。
Abstract The Advanced Implantation Detector Array (AIDA) is a state-of-the-art detector system for the measurement of the decay properties of exotic nuclei at fragmentation/fission facilities. Built around stacks of up to eight 8 cm× 8 cm, 128× 128 strip (16384 pixels) or up to four 24 cm× 8 cm, 384× 128 strip (49152 pixels) double sided silicon strip detectors, the positions of both implanted ions and their subsequent decay products can be measured to sub-mm precision. The large number of pixels per detector provide implant-decay correlations at implantation rates∼ kHz. To process signals from the large number of strips application specific integrated circuits provide low and high gain signal processing per strip (20 GeV and 20 MeV full scale range) with a dynamic range of 1000: 1, or better. A summary of the system and the analysis methodologies used are presented.