Energy- and time-resolved microscopy using PEEM: recent developments and state-of-the-art
Energy- and time-resolved microscopy using PEEM: recent developments and state-of-the-art
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DOI：
10.1088/1742-6596/100/7/072031
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发表时间：
2008-03
期刊：
影响因子：
--
通讯作者：
N. Weber;M. Escher;M. Merkel;A. Oelsner;G. Schönhense
中科院分区：
文献类型：
--
作者：
N. Weber;M. Escher;M. Merkel;A. Oelsner;G. Schönhense
讨论了两种新的光谱表面成像方法，它们都是基于光电子显微镜的。它们的特点是一个简单的电子光学装置，保留了一个线性柱。在光刻微网的基础上，研制了一种成像高通能量滤光片。由于网格大小仅为7μm，因此不会出现图像失真。目前的能量分辨率为70 meV。第二种方法采用飞行时间能量分散和使用延迟线探测器的时间分辨检测。在这种情况下，漂移能量和探测器的时间分辨率决定了能量分辨率。目前的时间分辨率为180ps，能量分辨率在100 meV范围内。
Two novel methods of spectroscopic surface imaging are discussed, both based on photoemission electron microscopy PEEM. They are characterised by a simple electron-optical set up retaining a linear column. An imaging high-pass energy filter has been developed on the basis of lithographically-fabricated microgrids. Owing to a mesh size of only 7μm, no image distortions occur. The present energy resolution is 70 meV. The second approach employs time-of-flight energy dispersion and time-resolved detection using a Delayline Detector. In this case, the drift energy and the time resolution of the detector determine the energy resolution. The present time resolution is 180 ps, giving rise to an energy resolution in the 100 meV range.