Plane wave diffraction by a large rectangular aperture in a thick conducting screen

Plane wave diffraction by a large rectangular aperture in a thick conducting screen
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厚导电屏中大矩形孔径的平面波衍射

DOI:
10.1109/iceaa.2017.8065597
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发表时间:
2017
期刊:
Proceedings of the 2017 International Conference on Electromagnetics in Advanced Applications (ICEAA '17)
影响因子:
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通讯作者:
Hirohide Serizawa
Hirohide Serizawa
中科院分区:
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文献类型:
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作者:
Fujiwara T;Fukuda H;Ozaki H;T. Hiejima;Hirohide Serizawa

文献摘要

相似文献

通过使用基于电磁平面波入射的小林势 (KP) 的精确解,针对各种结构参数(孔径大小、纵横比和屏幕厚度)和一些入射角,研究了厚导电屏幕中矩形孔的衍射。由于过去开发的计算代码对于大孔径的情况存在一些误差,因此我们特别通过改进的计算代码对大于半波长的矩形孔径进行重新计算来提供一些数值数据。此外,我们通过坡印廷矢量的二维矢量图来可视化孔径周围的功率流,以查看衍射状态。
The diffraction by a rectangular hole in a thick conducting screen is studied for various structural parameters (aperture sizes, aspect ratios, and screen's thicknesses) and some incident angles by using the exact solution based on the Kobayashi potential (KP) for the EM plane wave incidence. We especially provide some numerical data by recalculating for rectangular apertures greater than the half-wavelength with an improved calculation code, since the calculation code developed in the past has some errors for the case of the large apertures. In addition, we visualize the power flow around the aperture by means of the 2D vector plot of the Poynting vector to see the state of the diffraction.