Plane wave diffraction by a large rectangular aperture in a thick conducting screen
Plane wave diffraction by a large rectangular aperture in a thick conducting screen
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厚导电屏中大矩形孔径的平面波衍射
DOI:
10.1109/iceaa.2017.8065597
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发表时间:
2017
期刊:
影响因子:
--
通讯作者:
Hirohide Serizawa
中科院分区:
文献类型:
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作者:
Fujiwara T;Fukuda H;Ozaki H;T. Hiejima;Hirohide Serizawa
The diffraction by a rectangular hole in a thick conducting screen is studied for various structural parameters (aperture sizes, aspect ratios, and screen's thicknesses) and some incident angles by using the exact solution based on the Kobayashi potential (KP) for the EM plane wave incidence. We especially provide some numerical data by recalculating for rectangular apertures greater than the half-wavelength with an improved calculation code, since the calculation code developed in the past has some errors for the case of the large apertures. In addition, we visualize the power flow around the aperture by means of the 2D vector plot of the Poynting vector to see the state of the diffraction.