All-Optical dc Nanotesla Magnetometry Using Silicon Vacancy Fine Structure in Isotopically Purified Silicon Carbide
All-Optical dc Nanotesla Magnetometry Using Silicon Vacancy Fine Structure in Isotopically Purified Silicon Carbide
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DOI:
10.1103/physrevx.6.031014
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发表时间:
2016-07-28
影响因子:
12.5
通讯作者:
Astakhov, G. V.
中科院分区:
文献类型:
--
作者:
Simin, D.;Soltamov, V. A.;Astakhov, G. V.
We uncover the fine structure of a silicon vacancy in isotopically purified silicon carbide (4H-(SiC)-Si-28) and reveal not yet considered terms in the spin Hamiltonian, originated from the trigonal pyramidal symmetry of this spin-3/2 color center. These terms give rise to additional spin transitions, which would be otherwise forbidden, and lead to a level anticrossing in an external magnetic field. We observe a sharp variation of the photoluminescence intensity in the vicinity of this level anticrossing, which can be used for a purely all-optical sensing of the magnetic field. We achieve dc magnetic field sensitivity better than 100 nT/root Hz within a volume of 3 x 10(-7)mm(3) at room temperature and demonstrate that this contactless method is robust at high temperatures up to at least 500 K. As our approach does not require application of radio-frequency fields, it is scalable to much larger volumes. For an optimized light-trapping waveguide of 3 mm(3), the projection noise limit is below 100 fT/root Hz.