Measurement of complex permittivity of insulating materials for THz telecommunication modules
Measurement of complex permittivity of insulating materials for THz telecommunication modules
复制标题
太赫兹电信模块绝缘材料复介电常数的测量
DOI：
10.1109/ceidp.2012.6378816
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发表时间：
2012
期刊：
影响因子：
--
通讯作者：
K. Fujii
中科院分区：
文献类型：
--
作者：
K. Fukunaga;M. Mizuno;T. Tosaka;K. Fujii
介绍了介电材料复介电常数在20 GHz~3 THz范围内的测量方法。液晶聚合物的介电性能不受环境条件的影响，因此液晶可以成为用于太赫兹通信的绝缘材料的候选材料。
Measurement methods of complex permittivity of dielectric materials from 20 GHz to 3 THz are introduced. The dielectric properties of a liquid crystal polymer were not affected by environmental conditions, thus liquid crystal can become a candidate for insulating materials used in THz communications.