Three-dimensional force-field microscopy with optically levitated microspheres
Three-dimensional force-field microscopy with optically levitated microspheres
复制标题
具有光学悬浮微球的三维力场显微镜
DOI：
10.1103/physreva.99.023816
复制
发表时间：
2019-02-08
影响因子：
2.9
通讯作者：
Gratta, Giorgio
中科院分区：
文献类型：
--
作者：
Blakemore, Charles P.;Rider, Alexander D.;Gratta, Giorgio
我们报告使用4.7 μ m直径，光学悬浮，带电微球图像的三维力场上的Au涂层，微加工的硅梁在真空中的电荷分布。一个向上传播，单光束光学陷阱，结合干涉成像技术，提供了最佳的显微镜微球。在这个演示中，Au涂层表面的Si梁可以被带到接近类似于10 μ m从微球的中心，而力同时测量沿着所有三个正交轴，充分映射矢量力场超过总体积类似于10 - 6 μ m（3）。我们报告的力灵敏度为（2.5 +/- 1.0）x 10（-17）N/root Hz，在三个自由度中的每个自由度中，线性响应高达10（-13）N。虽然我们讨论了使用带电微球映射静电场的情况，但预计该技术可以扩展到其他力场，使用具有不同属性的微球。
We report on the use of 4.7-mu m-diameter, optically levitated, charged microspheres to image the three-dimensional force field produced by charge distributions on an Au-coated, microfabricated Si beam in vacuum. An upward-propagating, single-beam optical trap, combined with an interferometric imaging technique, provides optimal access to the microspheres for microscopy. In this demonstration, the Au-coated surface of the Si beam can be brought as close as similar to 10 mu m from the center of the microsphere while forces are simultaneously measured along all three orthogonal axes, fully mapping the vector force field over a total volume of similar to 10 6 mu m(3). We report a force sensitivity of (2.5 +/- 1.0) x 10(-17) N/root Hz, in each of the three degrees of freedom, with a linear response to up to similar to 10(-13) N. While we discuss the case of mapping static electric fields using charged microspheres, it is expected that the technique can be extended to other force fields, using microspheres with different properties.