Hybrid Flexible Resistive Random Access Memory-Gated Transistor for Novel Nonvolatile Data Storage
Hybrid Flexible Resistive Random Access Memory-Gated Transistor for Novel Nonvolatile Data Storage
复制标题
DOI:
10.1002/smll.201502243
复制
发表时间:
2016-01-20
期刊:
影响因子:
13.3
通讯作者:
Roy, V. A. L.
中科院分区:
文献类型:
--
作者:
Han, Su-Ting;Zhou, Ye;Roy, V. A. L.
Here, a single-device demonstration of novel hybrid architecture is reported to achieve programmable transistor nodes which have analogies to flash memory by incorporating a resistive switching random access memory (RRAM) device as a resistive switch gate for field effect transistor (FET) on a flexible substrate. A high performance flexible RRAM with a three-layered structure is fabricated by utilizing solution-processed MoS2 nanosheets sandwiched between poly(methyl methacrylate) polymer layers. Gate coupling with the pentacene-based transistor can be controlled by the RRAM memory state to produce a nonprogrammed state (inactive) and a programmed state (active) with a well-defined memory window. Compared to the reference flash memory device based on the MoS2 floating gate, the hybrid device presents robust access speed and retention ability. Furthermore, the hybrid RRAM-gated FET is used to build an integrated logic circuit and a wide logic window in inverter logic is achieved. The controllable, well-defined memory window, long retention time, and fast access speed of this novel hybrid device may open up new possibilities of realizing fully functional nonvolatile memory for high-performance flexible electronics.