Millimeter wave measurements of temperature dependence of complex permittivity of dielectric plates by a cavity resonance method
Millimeter wave measurements of temperature dependence of complex permittivity of dielectric plates by a cavity resonance method
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通过腔谐振法测量介电板复介电常数的温度依赖性的毫米波
DOI:
10.1109/apmc.1997.656347
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发表时间:
1997
期刊:
影响因子:
--
通讯作者:
T. Shimizu
中科院分区:
文献类型:
--
作者:
Y. Kobayashi;T. Shimizu
A novel circular cavity resonance method based on a rigorous analysis by the mode matching technique is proposed to measure the temperature dependences of complex permittivity of low loss dielectric plates accurately in the millimeter wave range 30-100 GHz. The measured results for GaAs substrates verify the usefulness.