Refraction-angle resolution of diffraction enhanced imaging
Refraction-angle resolution of diffraction enhanced imaging
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DOI：
10.1088/0031-9155/51/12/002
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发表时间：
2006-06
影响因子：
3.5
通讯作者：
Zhifeng Huang;Kejun Kang;Zheng Li
中科院分区：
文献类型：
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作者：
Zhifeng Huang;Kejun Kang;Zheng Li
X射线衍射增强成像（DEI）作为一种新方法，对于医学和生物领域的弱吸收低Z样品具有极高的灵敏度。空间分辨率和低对比度分辨率等常规性能参数不足以描述DEI系统的特性。本文重点关注折射角分辨率，它描述了 DEI 系统区分样品折射的 X 射线的能力。折射角分辨率分析由两部分组成：摇摆曲线某一位置测得的单张DEI图像分析和提取方法计算得到的折射角图像分析。进行了二维计算机模拟实验来证明分析结果。最后描述了折射角分辨率的局限性和结论。
As a new method, x-ray diffraction enhanced imaging (DEI) has extremely high sensitivity for weakly absorbing low-Z samples in medical and biological fields. Conventional performance parameters, such as spatial resolution and low-contrast resolution, are not enough to describe the characteristics of a DEI system. This paper focuses on refraction-angle resolution which describes the ability of a DEI system to differentiate the x-rays refracted by the sample. The analysis of refraction-angle resolution is composed of two parts: the analysis of the single DEI image measured in a certain position of the rocking curve and the analysis of the refraction-angle image calculated by extraction methods. A 2D computer simulation experiment is performed to prove the results of the analyses. The limitations and conclusions of refraction-angle resolution are described in the end.