An absolute phase technique for 3D profile measurement using four-step structured light pattern
An absolute phase technique for 3D profile measurement using four-step structured light pattern
复制标题
使用四步结构光图案进行 3D 轮廓测量的绝对相位技术
DOI：
10.1016/j.optlaseng.2012.03.009
复制
发表时间：
2012-09-01
影响因子：
4.6
通讯作者：
Chen, Ken
中科院分区：
文献类型：
--
作者：
Xu, Jing;Liu, Shaoli;Chen, Ken
本文的目的是开发一个四步模式编码策略，通过组合的三角波形，阶梯波形，和两个方波。所提出的图案编码策略使唯一相位分布范围达到10 pi，是传统四步相移编码方法2 pi的5倍。因此，所提出的编码策略使得基于结构光的测量系统能够测量复杂物体而不会产生模糊，这是相移算法的共同限制。此外，所提出的策略是一个像素级的方法，导致高密度的三维重建。该解码方法是一种与像素无关的计算，可以消除误差传播，提高可靠性。通过数值仿真比较了相移法和编码法的相位误差，两者相差很小。通过对不同目标的实验，验证了该编码策略的鲁棒性和准确性。实验结果表明，该方法对复杂物体的三维重建是有效的。(C)2012爱思唯尔有限公司保留所有权利。
The aim of this paper is to develop a four-step pattern encoding strategy through the combination of a triangle waveform, a step waveform, and two square waveforms. The proposed pattern encoding strategy makes the range of unique phase distribution up to 10 pi, which is 5 times as large as 2 pi of conventional four-step phase shifting encoding approach. Therefore, the proposed encoding strategy enables the structured light-based measurement system to measure complicated objects without ambiguity, which is the common limitation of the phase shifting algorithms. Furthermore, the proposed strategy is a pixel-level method, leading to a high-density 3D reconstruction. The decoding approach is a pixel independent computation, which can eliminate the error propagation and enhance the reliability. The phase errors between the phase shifting and the proposed encoding strategy are compared by the numerical simulation and they are very close. Experiments with different objects are carried out to validate the robustness and accuracy for the proposed encoding strategy. The results show that it is efficient for the 3D reconstruction of complicated objects. (C) 2012 Elsevier Ltd. All rights reserved.