Development of a lifting wavelet representation for surface characterization
Development of a lifting wavelet representation for surface characterization
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DOI：
10.1098/rspa.2000.0613
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发表时间：
2000-09
期刊：
影响因子：
--
通讯作者：
X. Jiang;L. Blunt;K. Stout
中科院分区：
文献类型：
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作者：
X. Jiang;L. Blunt;K. Stout
本文综述了表面计量学中现有的数值分析方法及其存在的问题。本文根据曲面功能分析的要求，提出了一种用于提取曲面不同分量的提升小波表示。介绍了提升小波的基本原理，提出了一种快速算法。表面的不同频率分量可以被分离、提取，然后根据功能分析的预期要求进行重构。可以突出显示表面纹理，并可以识别和清晰地恢复多标量地形特征。为了验证新模型的行为，使用基于正弦波形和三角波形的计算机模拟。以工程和生物工程中的一系列典型表面，如平面、圆柱和曲线，通过接触式（触针）和非接触式（相移干涉）测量仪器进行了实例研究，证明了提升小波模型在这些表面分析中的可行性和适用性。
This paper reviews the existing numerical analysis methods and their problems in surface metrology. Based on the requirements of functional analysis of surfaces, this paper proposes a lifting wavelet representation for extraction of different components of a surface. The theory of the lifting wavelet is introduced and a fast algorithm is developed. Different frequency components of the surface can be separated, extracted and then reconstructed according the intended requirements of functional analysis. The surface textures can be highlighted and multi–scalar topographical features can be identified and clearly recovered. In order to verify the behaviour of the new model, a computer simulation based on sinusoidal and triangular waveforms is used. Case studies are conducted using a series of typical surfaces of engineering and bioengineering, such as planes, cylinders and curves, measured by contact (stylus) and non–contact (phase–shifting interferometry) instruments, to demonstrate the feasibility and applicability of using the lifting wavelet model in the analysis of these surfaces.