X-ray crystal spectrometer with a charge-coupled-device detector for ion temperature measurements in the Large Helical Device
X-ray crystal spectrometer with a charge-coupled-device detector for ion temperature measurements in the Large Helical Device
复制标题
带有电荷耦合器件探测器的 X 射线晶体光谱仪，用于大型螺旋装置中的离子温度测量
DOI：
10.1063/1.1556942
复制
发表时间：
2003
影响因子：
1.6
通讯作者：
M. Goto
中科院分区：
文献类型：
--
作者：
S. Morita;M. Goto
本文设计了一台Johann型X射线晶体谱仪，利用ArXVII、TiXXI、CrXXIII或FeXXV的类He共振线的多普勒展宽，测量了大螺旋装置（LHD）等离子体中心的离子温度。将四个弯曲石英（2020）、（2023）、（3140）和（2243）晶体设置在四边形旋转晶体保持器中，用于测量来自这四个不同元件的X射线线。每个晶体都可以通过计算机网络从外部选择。通过将薄石英（0.7 mm）粘合在精确研磨的圆柱形蓝色玻璃板上来制造半径为3 m的弯曲晶体。通过沿晶体表面沿着扫描尖针来检查晶体的曲率。实验结果表明，该系统的测量精度达到1 μm，与设计的圆柱曲率吻合良好。通过对15年前制作的弯曲晶体的曲率测量，发现弯曲晶体表面结构有长期的变化。
A Johann-type x-ray crystal spectrometer has been designed using a ray tracing calculation and constructed for ion temperature measurement in the plasma center of a large helical device (LHD) using Doppler broadening of a He-like resonance line of ArXVII, TiXXI, CrXXIII, or FeXXV. Four curved quartz (2020), (2023), (3140), and (2243) crystals are set in a quadrangular rotary crystal holder for measuring the x-ray line from such four different elements. Each of the crystals can be externally selected through a computer network. The curved crystals with a radius of 3 m are fabricated by gluing thin quartz (0.7 mmt) on an accurately ground cylindrical blue glass plate. The curvature of the crystals was checked by scanning a sharp pin along the crystal surface. As a result, an excellent agreement with the designed cylindrical curvature was obtained with an accuracy of 1 μm. A secular change of the curved crystal surface structure was found by measuring the curvature of the curved crystal fabricated 15 years e...