Nondestructive two-dimensional phase imaging of embedded defects via on-chip spintronic sensor
Nondestructive two-dimensional phase imaging of embedded defects via on-chip spintronic sensor
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DOI：
10.1063/1.4729785
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发表时间：
2012-06
影响因子：
4
通讯作者：
Z. Cao;M. Harder;L. Fu;B. Zhang;W. Lu;G. Bridges;Y. Gui;Can-Ming Hu
中科院分区：
文献类型：
--
作者：
Z. Cao;M. Harder;L. Fu;B. Zhang;W. Lu;G. Bridges;Y. Gui;Can-Ming Hu
利用片上自旋电子传感器实现了微波近场相位成像技术。该传感器利用自旋电子学原理将微波场直接整流为直流电压信号，其中微波电场和磁场的相对相位起着重要作用。通过操纵相对相位，传感器可以非破坏性地检测亚波长尺寸的嵌入式缺陷。
A microwave near field phase imaging technique has been achieved by an on-chip spintronic sensor. The sensor directly rectifies a microwave field into a dc voltage signal by employing the spintronic principle, in which the relative phase between microwave electric and magnetic fields plays an important role. By manipulating the relative phase, the sensor can nondestructively detect embedded defects of subwavelength size.