mEosEM withstands osmium staining and Epon embedding for super-resolution CLEM
mEosEM withstands osmium staining and Epon embedding for super-resolution CLEM
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mEosEM 可承受锇染色和 Epon 嵌入，用于超分辨率 CLEM
DOI：
10.1038/s41592-019-0613-6
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发表时间：
2020-01-01
期刊：
影响因子：
48
通讯作者：
Xu, Pingyong
中科院分区：
文献类型：
--
作者：
Fu, Zhifei;Peng, Dingming;Xu, Pingyong
超分辨相关光电子显微镜（SR-CLEM）是一种在细胞超微结构背景下对特定分子进行纳米级成像的有力方法。Epon环氧树脂包埋为SR-CLEM提供了优势，包括超微结构保存和高质量切片。然而，Epon包埋消除了大多数荧光蛋白的荧光。我们描述了一种光可控荧光蛋白，mEosEM，可以生存Epon包埋后四氧化锇（OsO 4）处理改进SR-CLEM。mEosEM生存1%OsO4处理和Epon包埋改进的超分辨率相关的光学和电子显微镜。
Super-resolution correlative light and electron microscopy (SR-CLEM) is a powerful approach for imaging specific molecules at the nanoscale in the context of the cellular ultrastructure. Epon epoxy resin embedding offers advantages for SR-CLEM, including ultrastructural preservation and high quality sectioning. However, Epon embedding eliminates fluorescence from most fluorescent proteins. We describe a photocontrollable fluorescent protein, mEosEM, that can survive Epon embedding after osmium tetroxide (OsO4) treatment for improved SR-CLEM.mEosEM survives 1% OsO4 treatment and Epon embedding for improved super-resolution correlative light and electron microscopy.