The finer things in X-ray diffraction data collection
The finer things in X-ray diffraction data collection
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DOI：
10.1107/s090744499900935x
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发表时间：
1999-10-01
期刊：
影响因子：
--
通讯作者：
Pflugrath, JW
中科院分区：
文献类型：
--
作者：
Pflugrath, JW
从二维位置敏感探测器获得的x射线衍射图像可以被表征为厚或薄，这取决于每个图像的旋转角度增量是否大于或小于晶体嵌合度。在空间重叠、饱和像素、x射线背景和I/sigma(I)方面讨论了厚图像和薄图像处理的期望和结果。简要介绍了用于衍射图像处理的d*TREK软件套件，并将其结果与另一种流行软件包的结果进行了比较。
X-ray diffraction images from two-dimensional position-sensitive detectors can be characterized as thick or thin, depending on whether the rotation-angle increment per image is greater than or less than the crystal mosaicity, respectively. The expectations and consequences of the processing of thick and thin images in terms of spatial overlap, saturated pixels, X-ray background and I/sigma(I) are discussed. The d*TREK software suite for processing diffraction images is briefly introduced, and results from d*TREK are compared with those from another popular package.