Fault detecting experiments for sequential circuits
Fault detecting experiments for sequential circuits
复制标题
时序电路的故障检测实验
DOI:
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发表时间:
1964
期刊:
影响因子:
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通讯作者:
F. C. Hennine
中科院分区:
文献类型:
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作者:
F. C. Hennine
This paper describes the design of experimental procedures for determining whether or not a sequential switching circuit is operating in accordance with a given state-table description. These procedures are particularly easy to apply when the given state table is reduced, strongly-connected, and has a distinguishing sequence, and when the actual circuit has no more states than the given table. They can also be extended to cover more general cases, although the resulting experiments are more cumbersome.