Characterization at the Level of Individual Crystals: Single-Crystal MFI Type Zeolite Grains
Characterization at the Level of Individual Crystals: Single-Crystal MFI Type Zeolite Grains
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DOI：
10.1002/chem.201704213
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发表时间：
2018-02-16
影响因子：
4.3
通讯作者：
van Bokhoven, Jeroen A.
中科院分区：
文献类型：
--
作者：
Gruene, Tim;Li, Teng;van Bokhoven, Jeroen A.
从约150 × 100 × 50 nm的单个晶粒收集沸石Silicalite-1和ZSM-5（均为MFI骨架类型）的电子衍射数据（3）。以四丙基铵为结构导向剂合成了晶体。对于Silicalite-1，分辨率扩展到约0.8埃，对于ZSM-5晶体，分辨率扩展到约0.9-1.0埃。几个数据集的分析表明，在纳米尺度下，这些沸石晶体是单晶，而不是共生。
Electron-diffraction data on the zeolites Silicalite-1 and ZSM-5 (both MFI framework type) were collected from individual grains of about 150 x 100 x 50 nm(3). Crystals were synthesized with tetrapropylammonium as structure-direct-ing agent. The resolution extended to about 0.8 angstrom for Silicalite-1 and about 0.9-1.0 angstrom for ZSM-5 crystals. Analysis of several data sets showed that at the nanometre-scale, these zeolite crystals are single crystals and not intergrown.