Detection of High Impedance Fault in DC Microgrid Using Impedance Prediction Technique
Detection of High Impedance Fault in DC Microgrid Using Impedance Prediction Technique
复制标题
利用阻抗预测技术检测直流微电网高阻抗故障
DOI：
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发表时间：
2020
期刊：
影响因子：
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通讯作者：
S. A. Hosseini
中科院分区：
文献类型：
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作者：
Behrooz Taheri;S. A. Hosseini
本研究的目的是开发一个系统的程序检测高阻抗故障（HIF）在直流微电网。由于低电流幅值以及保护算法无法将其与正常开关事件和直流电机启动区分开来，因此HIF保护一直是微电网中最大的挑战之一。因此，本文提出了一种基于直流微网阻抗预测的高阻抗故障检测方法。所提出的技术开发的单极直流微电网与两电平电压源换流器（VSC）和使用MATLAB和PSCAD软件。结果支持HIF检测应用的开发技术的效率。该技术能够将HIF与正常的网络切换和直流电动机启动故障区分开。
The aim of this study is to develop a systematic procedure for detecting high impedance fault (HIF) in DC microgrid. Protection from HIF has been one of the biggest challenges in the microgrid due to the low-current magnitudes as well as the protection algorithms failing to distinguish it from normal switching events and DC motor starting. Accordingly, in this paper, a method for detecting high impedance fault based on DC microgrid impedance prediction is presented. The proposed technique is developed on a monopolar DC microgrid with two-level voltage source converters (VSCs) and using MATLAB and PSCAD software. Results support the efficiency of the developed technique for HIF detection application. This technique is capable of distinguishing HIF from normal network switching and DC motor starting failures.