Correlation between transition parameter and transition jitter using Voronoi cell modeling
Correlation between transition parameter and transition jitter using Voronoi cell modeling
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使用 Voronoi 单元建模的转换参数和转换抖动之间的相关性
DOI：
10.1016/j.jmmm.2004.10.021
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发表时间：
2005
影响因子：
2.7
通讯作者：
Y. Nakamura
中科院分区：
文献类型：
--
作者：
K. Miura;H. Muraoka;H. Aoi;Y. Nakamura
我们研究了过渡宽度和过渡抖动使用Voronoi单元建模，包括写入过程的影响。Voronoi细胞的平均直径对应于物理晶粒尺寸或磁团簇尺寸。在每个单元中施加的头场强度由动态介电常数和在中等动态介电常数下的头场梯度两者确定，其特征在于线性分布。因此，过渡抖动的强烈影响的晶粒尺寸或磁团簇的大小。由此计算，过渡宽度和过渡抖动的实际比率约为10：1-15：1。然而，该比率可以通过改变写入条件或介质参数而改变。结果表明，细胞的规则化对高分辨率和低噪声没有贡献。
We investigated transition width and transition jitter using Voronoi cell modeling including the effect of the writing process. The mean diameter of Voronoi cells corresponded to the physical grain size or the magnetic cluster size. The applied head field strength in each cell was determined by both dynamic coercivity and the head field gradient at the medium dynamic coercivity, which was characterized by a linear profile. As a result, transition jitter was strongly influenced by grain size or magnetic cluster size. From this calculation, the realistic ratio of transition width and transition jitter was about 10:1–15:1. However, the ratio may change by changing the writing condition or medium parameter. It was revealed that regularization of cells did not contribute to high resolution and low noise.