Fluorescence and predissociation of sulfur dioxide
Fluorescence and predissociation of sulfur dioxide
复制标题
二氧化硫的荧光和预解离
DOI：
10.1021/ja00754a072
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发表时间：
1971
影响因子：
15
通讯作者：
H. Okabe
中科院分区：
文献类型：
--
作者：
H. Okabe
在目前的工作中，荧光强度是在 2000 至 2300 A 范围内作为入射波长的函数进行测量的，其中光化学解离预计将与荧光竞争。如前所述测量SO 2 的吸收和未分散荧光强度作为入射波长的函数。简而言之，使用氢连续体作为光源。将长 6.95 厘米的荧光池放置在带有 600 线/毫米光栅的 1 米近法线入射真空单色仪的出口狭缝后面。对应于3A分辨率的0.2mm狭缝宽度用于测量吸收和荧光。荧光强度 7f 是通过具有“S”(Q) 光谱灵敏度阴极的 13 级光电倍增管以与入射光束成直角的方式测量的。透射波长为2300至4200埃的滤色片放置在倍增器前面以消除散射光。将7f归一化为入射光强度70，以获得相对荧光强度7f/70。
In the present work the fluorescence intensity was measured as a function of incidentwavelength in the region 2000to 2300 A, where photochemical dissocia-tion is expected to compete with fluorescence. The absorption andthe undispersed fluorescence intensity of S02 were measured as before7 as a function of inci-dent wavelength. In brief, a hydrogen continuum was used as a light source. A fluorescence cell, 6.95 cm in length, was placed behind the exit slit of a 1-m near-normal incidence vacuum monochromator with a 600-line/mm grating. A slit widthof 0.2 mm corre-sponding to a 3-A resolution was used for measuring both absorption and fluorescence. The fluorescence intensity, 7f, was measured at right angles to the incident beam by a 13-stage photomultiplier with a cathode of “S”(Q) spectral sensitivity. A color filter trans-mitting light of wavelength from 2300 to 4200 A was placed in front of the multiplier to eliminate thescattered light. 7f was normalized to the incident light intensity, 70, to obtain the relative fluorescence intensity, 7f/70.