Diagnostic Technique for Electrical Tree by Current Integration Method
Diagnostic Technique for Electrical Tree by Current Integration Method
复制标题
电流积分法电气树诊断技术
DOI：
10.1109/eic43217.2019.9046562
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发表时间：
2019
期刊：
影响因子：
--
通讯作者：
T. Takada
中科院分区：
文献类型：
--
作者：
S. Iwata;R. Kitani;T. Takada
通过电流积分系统的新诊断技术（以下简称“Q(t)-meter”）来评估聚合物材料绝缘性能的退化。 Q(t) 计测量插入直流高压电源和所研究的绝缘材料样品之间的电容器累积的积分电荷随时间的变化。 Q(t)-meter适用于监测直流电压下绝缘样品漏电流的时间依赖性。为了展示这种新器件的性能，我们评估了环氧树脂样品中“电树”的产生和传播对直流漏电流的影响。电树是高分子材料的典型电降解现象。因此，电力树的无损诊断方法值得期待。在这项研究中，通过两个针电极之间的交流高压在环氧树脂中产生电树。电极间距离为2mm。在Q(t)测量中，采样频率、总采样时间、直流施加时间和测试电压分别为2秒、600秒、900秒、250-1,000V。我们在电树生成之前、树生成之后和树传播之后的三个阶段进行了 Q(t) 测量。发现漏电流随着树长度的增加而增加。还观察到 Q(t) 曲线显着急剧上升和下降的趋势。假设“RC 电路模型”，对 Q(t) 计获得的实验结果进行了分析。
The degradation of insulating property of polymeric materials was evaluated by the new diagnostic technique of current integration system, hereafter referred to as the “Q(t)-meter”. The Q(t)-meter measures the change with time in integrated charge accumulated by a capacitor inserted between a DC high-voltage power supply and a sample of the insulation material under study. Q(t)-meter is suitable for the monitoring of time dependence of leakage current of the insulating sample under DC voltage. To demonstrate the performance of this new device, we evaluated the influence of generation and propagation of “electrical tree” in epoxy resin sample on DC leakage current. The electrical tree is a typical electrical degradation of polymeric materials. Hence, nondestructive diagnostic methods for electrical tree are expected. In this study, the electrical tree was generated in the epoxy resin by AC high voltage between two needle electrodes. The interelectrode distance was 2 mm. In the Q(t) measurement, the sampling frequency, total sampling time, DC applied time, and test voltages were 2 s, 600 s, 900 s, 250-1,000 V, respectively. We conducted Q(t) measurement at three stages of electrical treeing - before tree generation, after tree generation, and after tree propagation. It was found that the leakage current increased with increase in the tree length. A remarkable trend of steep rise and fall in the Q(t) curve was also observed. Experimental results obtained by the Q(t)-meter were analyzed assuming an “RC circuit model”.
DOI：
10.1109/aieepas.1962.4501280
发表时间：
1961
期刊：
Annual Report 1961 Conference on Electrical Insulation
影响因子：
--
作者：
D. W. Kitchin;O. S. Pratt
通讯作者：
O. S. Pratt
DOI：
10.1109/tdei.2017.006544
发表时间：
2017-06-01
影响因子：
3.1
作者：
Iddrissu, Ibrahim;Zheng, Hualong;Rowland, Simon M.
通讯作者：
Rowland, Simon M.