AFM tip-based cutting of grooves on permalloy nanowires for controlling the motion of magnetic domain walls

AFM tip-based cutting of grooves on permalloy nanowires for controlling the motion of magnetic domain walls
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DOI:
10.3850/978-981-11-2728-1_44
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发表时间:
2018-09
期刊:
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影响因子:
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通讯作者:
Joshua Jones;E. Brousseau;D. Read
Joshua Jones;E. Brousseau;D. Read
中科院分区:
其他
文献类型:
--
作者:
Joshua Jones;E. Brousseau;D. Read

文献摘要

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本文报道的研究提出了一种新的应用的AFM针尖为基础的纳米加工过程中的背景下,调查数据存储设备的发展。特别是,纳米级的凹槽是用AFM探针的尖端在由铁磁材料制成的纳米线的顶表面上加工的。切割这些凹槽的目的是产生人工钉扎位点,用于控制这种纳米线内磁畴壁的运动。当在55 nm厚和320 nm宽的坡莫合金纳米线上实施这种方法时获得的实验和计算结果表明,这种人工钉扎位点的强度随着加工凹槽的深度的增加而增加。预计在这种情况下,基于AFM针尖的纳米加工的应用可能有助于开发各种磁畴壁器件,包括用于逻辑功能,数据存储或传感器应用的磁畴壁器件。
The research reported in this paper presents a new application of the AFM tip-based nanomachining process in the context of investigating the development of data storage devices. In particular, nanoscale grooves are machined with the tip of an AFM probe on the top surface of nanowires made of a ferromagnetic material. These grooves are cut with the purpose of creating artificial pinning sites for controlling the motion of magnetic domain walls within such nanowires. The experimental and computational results obtained when implementing this approach on permalloy nanowires 55 nm thick and 320 nm wide show that the strength of such artificial pinning sites increases with the increase in the depth of the machined grooves. It is anticipated that the application of AFM tip-based nanomachining in this context could contribute to the development of a variety of magnetic domain wall devices including those for logic function, data storage or sensor applications.