'Hi-Fi AFM': high-speed contact mode atomic force microscopy with optical pickups
'Hi-Fi AFM': high-speed contact mode atomic force microscopy with optical pickups
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DOI：
10.1088/1361-6501/aad771
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发表时间：
2018-10-01
影响因子：
2.4
通讯作者：
Payton, O. D.
中科院分区：
文献类型：
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作者：
Russell-Pavier, F. S.;Picco, L.;Payton, O. D.
高速原子力显微镜（HS-AFM）是一项强大的新兴技术，用于深入了解实时纳米级动态和科学现象。通过测量材料特性、丰度计数和量纲分析，它可以在原子尺度上进行新一代的发现。在这里，我们展示了使用一个光学拾取单元（OPU），通常在个人电脑，高保真音响和游戏机在世界各地，作为一个垂直检测系统内的HS-AFM在接触模式下操作。OPU的位移性能与市售的+/- 15pm分辨率的激光多普勒振动仪进行了比较。通过识别悬臂梁在环境热激励下的两种共振模式，OPU实现了亚纳米灵敏度。为了证明传感器在快速扫描速度下的大动态范围，使用定制的基于opu的HS-AFM收集了步高超过100 nm和表面纹理小于10 nm的表面轮廓。高保真测量在短时间尺度内扩展到可见长度尺度，成像面积高达200 μ m(2)，像素率为200万像素s(-1)，尖端速度为10 mm s(-1)，面积率为25 μ m(2) s（-1）。
High-speed atomic force microscopy (HS-AFM) is a powerful emerging technique used to gain insight into real-time nanoscale dynamics and phenomena across the sciences. By performing measurements of material properties, abundancy counting and dimensional analysis, it enables a new generation of discoveries at the atomic scale. Here, we demonstrate the use of an optical pickup unit (OPU) typically found in PCs, hi-fis and games consoles worldwide, as a vertical detection system within in a HS-AFM operated in contact mode. The OPU displacement performance is compared to that of a commercially available laser Doppler vibrometer with +/- 15 pm resolution. Sub-nanometre sensitivity is achieved with an OPU, presented via the identification of two resonant modes of a cantilever stimulated by ambient thermal excitation. To demonstrate the large dynamic range of the sensor at fast scan-speeds, surface profiles with step heights in excess of 100 nm and surface textures less than 10 nm were collected using a custom OPU-based HS-AFM. The high-fidelity measurements are extended to visible length scales in short timescales by imaging areas of up to 200 mu m(2) area at a pixel rate of 2 megapixels s(-1), tip velocity of 10 mm s(-1) and area rate of 25 mu m(2) s(-1).