Temperature-Stable Dielectric Ceramics based on Na0.5Bi0.5TiO3
Temperature-Stable Dielectric Ceramics based on Na0.5Bi0.5TiO3
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DOI：
10.1016/j.jeurceramsoc.2017.12.032
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发表时间：
2017-12
影响因子：
5.7
通讯作者：
A. Zeb;S. Jan;F. Bamiduro;D. Hall;S. J. Milne
中科院分区：
文献类型：
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作者：
A. Zeb;S. Jan;F. Bamiduro;D. Hall;S. J. Milne
在技术上重要的温度范围- 55 °C至300 °C内，na0.5 bi0.5 tio3的多个离子取代产生了良好的介电性能。相对介电常数εr, = 1300 ± 15%是记录,低损耗角正切,tanδ ≤0.025 ,温度从310 °C到0 °C, tanδ增加到0.05− 55°C(1 千赫)有针对性的固溶体(1 - x) [0.85 na0.5bi0.5tio3 - 0.15 - ba0.8ca0.2ti1 yzryo3] -xNaNbO3: 0.3 x = ,y = 0.2。nanbo3含量x < 0.2的εr-T曲线在宽介电峰温度以下呈现频率相关的变化。较高水平的铌酸盐取代导致单峰频率色散，典型的正常弛豫铁电。性质的实验趋势表明，介电弯曲是真正的弛豫介电峰，并表现为由于与独立的宽介电峰重叠而产生的弯曲。讨论了与工艺有关的阳离子和氧空位及其对介电性能的可能贡献。
Multiple ion substitutions to Na0.5Bi0.5TiO3give rise to favourable dielectric properties over the technologically important temperature range −55 °C to 300 °C. A relative permittivity, εr, = 1300 ± 15% was recorded, with low loss tangent, tanδ ≤ 0.025, for temperatures from 310 °C to 0 °C, tanδ increasing to 0.05 at −55 °C (1 kHz) in the targeted solid solution (1–x)[0.85Na0.5Bi0.5TiO3–0.15Ba0.8Ca0.2Ti1-yZryO3]–xNaNbO3: x = 0.3, y = 0.2. The εr-T plots for NaNbO3contents x < 0.2 exhibited a frequency-dependent inflection below the temperature of a broad dielectric peak. Higher levels of niobate substitution resulted in a single peak with frequency dispersion, typical of a normal relaxor ferroelectric. Experimental trends in properties suggest that the dielectric inflection is the true relaxor dielectric peak and appears as an inflection due to overlap with an independent broad dielectric peak. Process-related cation and oxygen vacancies and their possible contributions to dielectric properties are discussed.