High-resolution total-cross-section measurements for electron scattering from Ar, Kr, and Xe employing a threshold-photoelectron source
High-resolution total-cross-section measurements for electron scattering from Ar, Kr, and Xe employing a threshold-photoelectron source
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使用阈值光电子源对 Ar、Kr 和 Xe 的电子散射进行高分辨率全截面测量
DOI：
10.1103/physreva.84.062717
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发表时间：
2011
影响因子：
2.9
通讯作者：
K. Ito
中科院分区：
文献类型：
--
作者：
M. Kurokawa;M. Kitajima;K. Toyoshima;T. Kishino;T. Odagiri;H. Kato;M. Hoshino;H. Tanaka;K. Ito
采用阈值光电子源的实验技术，获得了电子能量为7 meV至20 eV的电子与Ar和Xe散射的绝对总截面。测得的总截面与其他团体获得的低至100毫电子伏，以上几个实验工作已报道的那些是在很好的协议。从目前的总截面和我们最近的结果，Kr使用修改后的有效射程理论的电子散射Ar，Kr，和氘的散射长度确定。在本分析中获得的散射长度的值不同于从以前的群实验和束实验确定的值。由于Feshbach共振的Ar，Kr，和氘的总截面中的共振结构的能量分辨率提高也进行了测量。基于自旋相关的共振散射理论对共振结构进行了分析，以精确地确定Ar、Kr和Ar的Feshbach共振的自然宽度值。
Absolute total cross sections for electron scattering from Ar and Xe at electron energies ranging from 7 meV to 20 eV were obtained with the experimental technique employing the threshold-photoelectron source. The measured total cross sections are in good agreement with those obtained by other groups down to 100 meV, above which several experimental works have been reported. Scattering lengths for electron scattering from Ar, Kr, and Xe were determined from the present total cross sections and our recent results for Kr using the modified effective range theory. The values of the scattering length obtained in the present analysis differ from the values determined from the previous swarm experiments and beam experiments. The resonant structures in the total cross sections due to Feshbach resonances of Ar, Kr, and Xe with an improved energy resolution were also measured. Analyses of the resonant structure were carried out based on the spin-dependent resonant scattering theory in order to determine the values of the natural width of Feshbach resonances of Ar, Kr, and Xe precisely.