Terabit-per-square-inch data storage with the atomic force microscope
Terabit-per-square-inch data storage with the atomic force microscope
复制标题
DOI：
10.1063/1.125390
复制
发表时间：
1999-11-29
影响因子：
4
通讯作者：
Quate, CF
中科院分区：
文献类型：
--
作者：
Cooper, EB;Manalis, SR;Quate, CF
面密度为1.6 Tbits/in。(2)已经实现了阳极氧化钛与原子力显微镜（AFM）。这种密度是通过以下方式实现的：（1）在AFM悬臂梁上选择性生长单壁碳纳米管，（2）在α-Al 2 O 3（1012）上原子级平坦的钛表面，以及（3）使用双折射模式AFM进行原子级力和位置控制。通过组合这些元件，在室温下在空气中以5 kbit/s的速率在20 nm间距上写入8 nm比特。(C)1999年美国物理学会。[S0003-6951（99）02248-2]。
An areal density of 1.6 Tbits/in.(2) has been achieved by anodically oxidizing titanium with the atomic force microscope (AFM). This density was made possible by (1) single-wall carbon nanotubes selectively grown on an AFM cantilever, (2) atomically flat titanium surfaces on alpha-Al2O3 (1012), and (3) atomic scale force and position control with the tapping-mode AFM. By combining these elements, 8 nm bits on 20 nm pitch are written at a rate of 5 kbit/s at room temperature in air. (C) 1999 American Institute of Physics. [S0003-6951(99)02248-2].