An experimental study on the cavitation of water with effects of SiO2 nanoparticles

An experimental study on the cavitation of water with effects of SiO2 nanoparticles
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SiO2纳米粒子影响水空化的实验研究

DOI:
10.1016/j.expthermflusci.2016.07.009
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发表时间:
2016-12-01
影响因子:
3.2
通讯作者:
Chen, Min
Chen, Min
中科院分区:
工程技术2区
文献类型:
--
作者:
Gu, Youwei;Li, Buxuan;Chen, Min

文献摘要

被引文献

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空化压力是液体抗拉强度的一种度量,在流体力学中,它决定了空化的起始。已知先前测量的压力由于作为成核位点的固体杂质的存在而显著不同。最近的一项研究报告说,水可以用固体杂质稳定,如SiO2纳米颗粒。这些纳米颗粒应该与水形成稳定的氢键。本文采用声学方法,在0 ~ 80 ℃温度范围内,研究了SiO2纳米颗粒对空化初生的影响。直径为20、50和100 nm的SiO2颗粒分散在脱气水中。计算了临界气泡的无量纲自由能。与超纯水相比,含SiO2水的空化压力和临界气泡自由能均有所降低。颗粒浓度的增加进一步降低了空化压力和临界气泡自由能。随着颗粒粒径的增大,空化压力没有明显的变化。结果表明,SiO2纳米颗粒是不稳定的杂质,总是促进空化起始在当前的实验条件下的水。(C)2016 Elsevier Inc. All rights reserved.
Cavitation pressure is a measure of liquid tensile strength, which determines the cavitation inception in hydrodynamics. The previously measured pressure is known to be significantly different because of the presence of solid impurities serving as nucleation sites. A recent study reported that water can be stabilized with solid impurities such, as SiO2 nanoparticles. These nanoparticles are supposed to form stabilized hydrogen bonds with water. In the present paper, the effects of SiO2 nanoparticles on cavitation inception are investigated experimentally through acoustic method at 1 atm and temperatures from 0 degrees C to 80 degrees C. With diameters of 20, 50 and 100 nm, SiO2 particles are dispersed into degassed water. The dimensionless free energy of critical bubble is also calculated. Both the cavitation pressure and the free energy of critical bubble of water with SiO2 decrease when compared with those of ultrapure water. The increase of particle concentration further decrease the cavitation pressure and the free energy of critical bubble. Increasing particle size, the cavitation pressure has no measurable difference. Results show that SiO2 nanoparticles are destabilizing impurities, which always promote the cavitation inception of water within current experimental conditions. (C) 2016 Elsevier Inc. All rights reserved.