A Class of Multiple Run Sampling Plans
A Class of Multiple Run Sampling Plans
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DOI:
10.1080/00401706.1979.10489744
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发表时间:
1979-05
期刊:
影响因子:
2.5
通讯作者:
Lonnie C. Vance;G. C. McDonald
中科院分区:
文献类型:
--
作者:
Lonnie C. Vance;G. C. McDonald
This article presents a class of attribute sampling plans based on the theory of runs. These plans call for the acceptance of a process if a run of specified length of nondefective items occurs before a fixed number of defectives have been observed. Recursion formulas for the probabilities of rejection and acceptance at each stage of sampling are derived. The operating characteristic (OC) curves, the average sample number (ASN) curves. and the variance of sample number (VSN) curves are given for representative plans within the class. This new class of plans is compared with a sequential plan and with a related sampling plan, also based on the theory of runs, which accepts a process if a run of specified length of nondefective items occurs in a fixed number of trials.