Nanoscale indentation and scratch of short carbon fiber reinforced PEEK/PTFE composite blend by atomic force microscope lithography
Nanoscale indentation and scratch of short carbon fiber reinforced PEEK/PTFE composite blend by atomic force microscope lithography
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DOI：
10.1023/a:1008812915701
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发表时间：
1999-01-01
影响因子：
2.3
通讯作者：
Friedrich, K
中科院分区：
文献类型：
--
作者：
Han, YC;Schmitt, S;Friedrich, K
原子力显微镜（AFM）已成为表征不同类型材料表面的常用工具。本文采用AFM-SPM光刻技术对短碳纤维增强PEEK/PTFE复合材料共混物进行了纳米级划痕和压痕试验。在划痕测试中，通过以恒定速度和固定施加的力在表面上移动尖端，在PEEK基质表面上制造具有纳米尺度尺寸的凹槽。凹槽由一个中央槽和两侧的堆积物组成。这些凹槽提供了关于各相的变形机制和耐刮擦性的信息。在聚合物相的纳米压痕和划痕中，微犁削和微切削是主要的磨损机制。较硬的相，即，石墨和碳纤维会因微裂纹事件而磨损。
The atomic force microscope (AFM) has become a popular tool for characterizing surfaces of different types of materials. In this paper a new technology of AFM-SPM lithography was used to conduct nanoscale scratch and indentation tests on a short carbon fiber reinforced PEEK/PTFE composite blend. In the scratch test, by moving the tip across the surface at constant velocity and fixed applied force, grooves with nanometer scale dimensions were fabricated on the PEEK matrix surfaces. The grooves consisted of a central trough with pile-ups on each side. These grooves provided information about deformation mechanisms and scratch resistance of the individual phases. In the nanoscale indentation and scratch of the polymeric phases, microploughing and microcutting are the dominant wear mechanisms. The harder phases, i.e., graphite and carbon fibers, get worn by microcracking events.