Measurement of ultimate tensile strength and Young modulus in LYSO scintillating crystals

Measurement of ultimate tensile strength and Young modulus in LYSO scintillating crystals
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DOI:
10.1016/j.nima.2011.07.023
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发表时间:
2011-10-21
影响因子:
1.4
通讯作者:
Paone, Nicola
Paone, Nicola
中科院分区:
物理与天体物理3区
文献类型:
--
作者:
Scalise, Lorenzo;Rinaldi, Daniele;Paone, Nicola

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闪烁晶体用于高能物理、医学成像、诊断和安全。测量了 x=0.1 (LYSO) 镥氧原硅酸盐铈掺杂 Lu2(1-x)Y2xSiO5:Ce (LYSO) 晶体的两个机械性能:极限拉应力 (curs) 和杨氏弹性模量 (E)。测量是通过四点加载装置进行的,实验结果说明了弹性-脆性应力-应变关系,这在很大程度上取决于样本制备和材料缺陷。沿[0 1 0]拉伸方向的sigma(UTS)范围在68.14和115.61 MPa之间,在最低情况下,是PbWO4 (PWO)测量值的两倍以上,显示出退火和未退火样品之间的显着差异。沿同一方向的平均弹性模量 (E) 为 E=1.80 x 10(11) ( +/- 2.15 x 10(10)) N/m(2),相对于 UTS 数据具有较低的离散度。这种类型的分析和研究可以基于从生产中取出的样品纳入晶体的质量控制程序中;可以为晶体的工业加工建立此类程序,以用于高能物理(热量计)和医学成像(PET等)应用。 (C) 2011 Elsevier B.V. 保留所有权利。
Scintillating crystals are employed in high energy physics, in medical imaging, diagnostic and security. Two mechanical properties of lutetium-yttrium oxyorthosilicate cerium-doped Lu2(1-x)Y2xSiO5:Ce with x=0.1 (LYSO) crystals have been measured: the ultimate tensile stress (curs) and the Young elastic modulus (E). Measurements are made by means of a 4-points loading device and the experimental results account for an elastic-brittle stress-strain relation, which depends heavily on the specimen preparation and the material defects. sigma(UTS) along the [0 1 0] tensile direction ranges within 68.14 and 115.61 MPa, which, in the lowest case, is more than twice with respect to those measured for PbWO4 (PWO), exhibiting a marked difference between the annealed and the not-annealed samples. The mean elastic modulus (E), along the same direction, is E=1.80 x 10(11) ( +/- 2.15 x 10(10)) N/m(2), with lower dispersion respect to UTS data. This type of analysis and study can be included into quality control procedures of crystals, based on samples taken out of production; such procedures can be established for industrial processing of crystals aimed to the high energy physics (calorimeters) and medical imaging (PET, etc.) applications. (C) 2011 Elsevier B.V. All rights reserved.