An Intrinsic Characterization of Approximate Probabilistic Bisimilarity
An Intrinsic Characterization of Approximate Probabilistic Bisimilarity
复制标题
近似概率双相似性的内在表征
DOI：
10.1007/3-540-36576-1_13
复制
发表时间：
2003
期刊：
影响因子：
--
通讯作者：
J. Worrell
中科院分区：
文献类型：
--
作者：
F. Breugel;M. Mislove;Joël Ouaknine;J. Worrell
在以前的工作中，我们研究了标记马尔可夫过程的近似双相似性的概念。我们认为这种概念比（精确的）双相似度更现实，更可行。基本理论中使用的主要技术工具是关于概率度量的哈钦森度量。本文根据（精确）相似度的概念给出了近似双相似度的一个更基本的表征。特别地，我们证明了近似双相似的拓扑是Lawson拓扑，相对于模拟预阶。为了补充这个抽象的特征，我们给出了相似性的统计说明，并通过扩展，近似双相似性，在Larsen和Skou的过程测试形式主义方面。
In previous work we have investigated a notion of approximate bisimilarity for labelled Markov processes. We argued that such a notion is more realistic and more feasible to compute than (exact) bisimilarity. The main technical tool used in the underlying theory was the Hutchinson metric on probability measures. This paper gives a more fundamental characterization of approximate bisimilarity in terms of the notion of (exact) similarity. In particular, we show that the topology of approximate bisimilarity is the Lawson topology with respect to the simulation preorder. To complement this abstract characterization we give a statistical account of similarity, and by extension, of approximate bisimilarity, in terms of the process testing formalism of Larsen and Skou.