In Situ Electric-Field Study of Surface Effects in Domain Engineered Pb(In1/2Nb1/2)O3-Pb(Mg1/3Nb2/3)O3-PbTiO3 Relaxor Crystals by Grazing Incidence Diffraction
In Situ Electric-Field Study of Surface Effects in Domain Engineered Pb(In1/2Nb1/2)O3-Pb(Mg1/3Nb2/3)O3-PbTiO3 Relaxor Crystals by Grazing Incidence Diffraction
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DOI：
10.3390/cryst10090728
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发表时间：
2020-08
期刊：
影响因子：
2.7
通讯作者：
M. Cain;M. Staruch;P. Thompson;C. Lucas;D. Wermeille;Y. Kayser;B. Beckhoff;S. Lofland;P. Finkel
中科院分区：
文献类型：
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作者：
M. Cain;M. Staruch;P. Thompson;C. Lucas;D. Wermeille;Y. Kayser;B. Beckhoff;S. Lofland;P. Finkel
本文对0.24Pb(In1/2Nb1/2)O3-PbTiO3(PIN-PMN-PT)[011]极化菱面体单晶的掠入射X射线衍射进行了研究。在外加电场作用下，原位测量了近表面微结构(最上面的几十个到几百个单胞)。根据晶格参数的变化计算的应变与用粘贴在样品表面的应变计测量的宏观应变进行了比较。研究了晶体表面电应变随温度变化的深度关系。分析揭示了隐藏的甜蜜点，其特征是异常高的应变，这是作为晶格面深度、温度和取向的函数观察到的。
In this work, we present a grazing incidence X-ray diffraction study of the surface of a 0.24Pb(In1/2Nb1/2)O3-Pb(Mg1/3Nb2/3)O3-PbTiO3 (PIN-PMN-PT) [011] poled rhombohedral single crystal. The near surface microstructure (the top several tens to hundreds of unit cells) was measured in situ under an applied electric field. The strains calculated from the change in lattice parameters have been compared to the macroscopic strain measured with a strain gauge affixed to the sample surface. The depth dependence of the electrostrain at the crystal surface was investigated as a function of temperature. The analysis revealed hidden sweet spots featuring unusually high strains that were observed as a function of depth, temperature and orientation of the lattice planes.