Nanostructure analysis using spatially modulated illumination microscopy
Nanostructure analysis using spatially modulated illumination microscopy
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DOI:
10.1038/nprot.2007.399
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发表时间:
2007-01-01
期刊:
影响因子:
14.8
通讯作者:
Birk, Udo J.
中科院分区:
文献类型:
--
作者:
Baddeley, David;Batram, Claudia;Birk, Udo J.
We describe the usage of the spatially modulated illumination (SMI) microscope to estimate the sizes (and/or positions) of fluorescently labeled cellular nanostructures, including a brief introduction to the instrument and its handling. The principle setup of the SMI microscope will be introduced to explain the measures necessary for a successful nanostructure analysis, before the steps for sample preparation, data acquisition and evaluation are given. The protocol starts with cells already attached to the cover glass. The protocol and duration outlined here are typical for fixed specimens; however, considerably faster data acquisition and in vivo measurements are possible.