Nanoscale mechanical contacts probed with ultrashort acoustic and thermal waves
Nanoscale mechanical contacts probed with ultrashort acoustic and thermal waves
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DOI：
10.1103/physrevb.80.235409
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发表时间：
2009-12-01
影响因子：
3.7
通讯作者：
Gusev, Vitalyi E.
中科院分区：
文献类型：
--
作者：
Dehoux, Thomas;Wright, Oliver B.;Gusev, Vitalyi E.
利用超快光学技术，我们测量了相干声子脉冲反射和热流通过之间的薄金属膜和球形介电压头的纳米级厚度的机械接触。皮秒声子波包在类似于50 GHz的返回从这个接口探针的压力分布，接触面积，和压痕轮廓亚纳米分辨率，揭示了薄膜变形原位。这些测量和同时热波成像在大于或类似于1 MHz是一致的声子传输的显着增强的近接触纳米间隙。
Using an ultrafast optical technique we measure coherent phonon-pulse reflection from-and heat flow across-a mechanical contact of nanoscale thickness between a thin metal film and a spherical dielectric indenter. Picosecond phonon wave packets at similar to 50 GHz returning from this interface probe the pressure distribution, the contact area, and the indentation profile to subnanometer resolution, revealing the film deformation in situ. These measurements and simultaneous thermal-wave imaging at greater than or similar to 1 MHz are consistent with significant enhancement of phonon transport across the near-contact nanogap.